• DocumentCode
    171131
  • Title

    Low-phase error and high isolation CMOS active balun

  • Author

    Sen Wang ; Chih-Hsuan Lee

  • Author_Institution
    Dept. of Electron. Eng., Nat. Taipei Univ. of Technol., Taipei, Taiwan
  • fYear
    2014
  • fDate
    1-6 June 2014
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    In this paper, a C-band active balun is demonstrated in a standard 0.18-μm CMOS process. Based on the proposed phase-correction technique (PCT) and the bridged-T network (BTN), the balun features low-phase error and high isolation, respectively. The PCT is based on a three balun topology, and the BTN is formed by the output matching networks and an isolation resistor. The balun consumes 1.8 mW from 1.2V-supply voltage, and features a peak gain of 4.6 dB at 4.6 GHz. The measured isolation is better than 18 dB, and the phase error is less than 1.6° from 4.6 GHz to 5.7 GHz.
  • Keywords
    CMOS integrated circuits; baluns; C-band active balun; CMOS active balun; bridged-T network; frequency 4.6 GHz to 5.7 GHz; gain 4.6 dB; isolation resistor; output matching networks; phase-correction technique; power 1.8 mW; size 0.18 mum; voltage 1.2 V; CMOS integrated circuits; Impedance matching; Active balun; gain error; phase correction;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium (IMS), 2014 IEEE MTT-S International
  • Conference_Location
    Tampa, FL
  • Type

    conf

  • DOI
    10.1109/MWSYM.2014.6848362
  • Filename
    6848362