Quantitative analysis of resistance variations in as-deposited nickel-phosphorus (NiP) embedded resistors

Author

Cheng, P.L. ; Leung, S.Y.Y. ; Law, T.W. ; Liu, C.K. ; Chong, I.T. ; Lam, D.C.C.

Author_Institution

Hong Kong University of Science and Technology

fYear

2003

Firstpage

156

Lastpage

160

Keywords

Conductivity; Copper; Costs; Electric resistance; Electrodes; Geometrical optics; Laser tuning; Resistors; Resists; Substrates;

fLanguage

English

Publisher

ieee

Conference_Titel

Electronic Components and Technology Conference, 2003. Proceedings. 53rd

ISSN

0569-5503

Print_ISBN

0-7803-7791-5

Type

DOI

10.1109/ECTC.2003.1216271

Filename

1216271

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