Title :
Quantitative analysis of resistance variations in as-deposited nickel-phosphorus (NiP) embedded resistors
Author :
Cheng, P.L. ; Leung, S.Y.Y. ; Law, T.W. ; Liu, C.K. ; Chong, I.T. ; Lam, D.C.C.
Author_Institution :
Hong Kong University of Science and Technology
Keywords :
Conductivity; Copper; Costs; Electric resistance; Electrodes; Geometrical optics; Laser tuning; Resistors; Resists; Substrates;
Conference_Titel :
Electronic Components and Technology Conference, 2003. Proceedings. 53rd
Print_ISBN :
0-7803-7791-5
DOI :
10.1109/ECTC.2003.1216271
