• DocumentCode
    1711730
  • Title

    Characterizations of (SiO,Cr1-x)yN1-y thin film resistors for integrated passive application

  • Author

    Wu, Fan ; Morris, James E.

  • Author_Institution
    Medtronic, Inc.
  • fYear
    2003
  • Firstpage
    161
  • Lastpage
    166
  • Keywords
    Atomic force microscopy; Conductivity; Costs; Nitrogen; Resistors; Sheet materials; Sputtering; Stability; Temperature; Transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 2003. Proceedings. 53rd
  • ISSN
    0569-5503
  • Print_ISBN
    0-7803-7791-5
  • Type

    conf

  • DOI
    10.1109/ECTC.2003.1216272
  • Filename
    1216272