• DocumentCode
    1711927
  • Title

    The fine pitch direct bonding technology for chip interconnection

  • Author

    Tohyama, Hiroshi ; Ozawa, Susumu ; Kitayama, Yuko ; Yamashita, Toshimitsu ; Nakamura, Yukio

  • Author_Institution
    Oki Electr. Ind. Co. Ltd., Tokyo, Japan
  • fYear
    1998
  • Firstpage
    82
  • Lastpage
    87
  • Abstract
    We have developed new direct bonding technology using anisotropic conductive film (ACF) connections between two chips. We applied this bonding technology in ultra fine pitch interconnections at 40 /spl mu/m between an LED array and a driver IC, and realized a minimized LED print head. The key point of direct bonding technology is assurance of connection reliability which can be improved by two important factors. One is the elastic recovery quantity of conductive particles between the connection electrodes, and the other is the adhesive strength of the chip bonding area. As a result of analysis with particular attention paid to these factors, we found two further features: (1) an elastic recovery quantity usually obtained by using soft conductive particles which was included in ACF, in the case of electrodes with variable form and hardness; (2) adhesive strength increased when accompanied with a rise in the curing temperature. We tested this technology by interconnection of 192 connection pads lined in 40 /spl mu/m pitch, and achieved good bonding reliability in temperature and relative humidity cycling tests. This new bonding technology is effective in ultra-fine pitch direct bonding, so that this technology can be widely applied to various types of device chip. In this paper, the details of the technology and the connection reliability are reported.
  • Keywords
    LED printers; adhesives; conducting polymers; driver circuits; electrodes; fine-pitch technology; hardness; heat treatment; humidity; integrated circuit bonding; integrated circuit interconnections; integrated circuit packaging; integrated circuit reliability; integrated circuit testing; microassembling; polymer films; recovery; thermal stresses; 40 micron; LED array; adhesive strength; anisotropic conductive film connections; bonding reliability; bonding technology; chip bonding area; chip interconnection; conductive particles; connection electrodes; connection pad pitch; connection reliability; curing temperature; direct bonding technology; driver IC; elastic recovery; electrode form; electrode hardness; fine pitch direct bonding technology; interconnection testing; minimized LED print head; soft conductive particles; temperature/relative humidity cycling tests; ultra fine pitch interconnections; ultra-fine pitch direct bonding; Adhesive strength; Anisotropic conductive films; Bonding; Curing; Elastic recovery; Electrodes; Humidity; Light emitting diodes; Temperature; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    IEMT/IMC Symposium, 2nd 1998
  • Conference_Location
    Tokyo, Japan
  • Print_ISBN
    0-7803-5090-1
  • Type

    conf

  • DOI
    10.1109/IEMTIM.1998.704527
  • Filename
    704527