Title :
Reducing RF parameter tests for test cost reduction: device model, hypothesis testing and experiment verification
Author :
Awad, Maricttc ; Li, Jing
Author_Institution :
IBM Microelectronics
Keywords :
Circuit testing; Costs; Hardware; Linear regression; Logistics; Low-noise amplifiers; Microelectronics; Noise figure; RF signals; Radio frequency;
Conference_Titel :
Electronic Components and Technology Conference, 2003. Proceedings. 53rd
Print_ISBN :
0-7803-7791-5
DOI :
10.1109/ECTC.2003.1216287
