DocumentCode
1712659
Title
Optimising edge detection
Author
Witts, W. I C ; Otto, G.P.
Author_Institution
Dept. of Comput. Sci., Univ. Coll. of London, UK
fYear
1988
Firstpage
279
Abstract
A feature detector is described that bases its research on a set of probability distributions that describe the situations in which the feature can be found. The result is a measure of the probability of the feature occurring at a particular point. The probabilities required to operate this detector can be automatically derived from test images, although it can be altered to detect any kind of feature. The output from this detector is a set of probabilities that represent the likelihood of and edge occurring at each point in the image. These need only to be summed to find the probability of an edge over an interval, and, in a similar fashion, images can be subsampled in order to find probable edges to subpixel accuracy
Keywords
optimisation; pattern recognition; probability; edge detection; feature detector; optimisation; pattern recognition; probability distributions; subpixel accuracy; Computer science; Computer vision; Detectors; Educational institutions; Image edge detection; Image segmentation; Signal processing; Training data;
fLanguage
English
Publisher
ieee
Conference_Titel
Pattern Recognition, 1988., 9th International Conference on
Conference_Location
Rome
Print_ISBN
0-8186-0878-1
Type
conf
DOI
10.1109/ICPR.1988.28222
Filename
28222
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