• DocumentCode
    1712876
  • Title

    An investigation of the material and process parameters for thin-film MCM-D and MCM-L technologies up to 100GHz

  • Author

    Grzyb, Janusz ; Ruiz, Ivan ; Cottet, Didier ; Troster, Gerhard

  • Author_Institution
    ETH Zurich
  • fYear
    2003
  • Firstpage
    478
  • Lastpage
    486
  • Keywords
    Dielectric constant; Dielectric losses; Dielectric materials; Dielectric measurements; Dielectric substrates; Equations; Frequency; Microstrip; Permittivity measurement; Transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 2003. Proceedings. 53rd
  • ISSN
    0569-5503
  • Print_ISBN
    0-7803-7791-5
  • Type

    conf

  • DOI
    10.1109/ECTC.2003.1216322
  • Filename
    1216322
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1712876