DocumentCode
1712959
Title
Near-field techniques for detecting EMI sources
Author
Baudry, David ; Bicrel, F. ; Bouchelouk, L. ; Louis, A. ; Mazari, B. ; Eudeline, P.
Author_Institution
IRSEEM, Mont-Saint-Aignan, France
Volume
1
fYear
2004
Firstpage
11
Abstract
A completely automatic near-field mapping system has been developed within IRSEEM (French research institute for electronic embedded systems) in order to determine the electric field radiated by electronic systems. This test bench uses a 3D probe positioning system to make accurate measurements. The paper presents a validation of the test bench on a microstrip line and experimental results realized on a diode limiter function.
Keywords
electric field measurement; electric noise measurement; electromagnetic interference; electronic equipment testing; test facilities; 3D probe positioning system; EMI source detection; diode limiter function; electric field radiation; electronic systems; microstrip line; near-field mapping system; test bench; Circuit testing; Electric variables measurement; Electromagnetic interference; Electromagnetic measurements; Laser modes; Microstrip; Probes; Robot kinematics; Robot vision systems; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Compatibility, 2004. EMC 2004. 2004 InternationalSymposium on
Print_ISBN
0-7803-8443-1
Type
conf
DOI
10.1109/ISEMC.2004.1349987
Filename
1349987
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