DocumentCode
171333
Title
A 50 – 60 GHz rectifier with −7dBm sensitivity for 1 V DC output voltage and 8% efficiency in 65-nm CMOS
Author
Hao Gao ; Matters-Kammerer, Marion K. ; Milosevic, D. ; van Roermund, Arthur ; Baltus, P.
Author_Institution
Mixed-Signal Microelectron. Group, Eindhoven Univ. of Technol., Eindhoven, Netherlands
fYear
2014
fDate
1-6 June 2014
Firstpage
1
Lastpage
3
Abstract
This paper presents a 50 - 60 GHz fully integrated 3-stage rectifier in 65nm CMOS technology. The sensitivity of the rectifier is the limiting factor for an on-chip wireless-powered receiver in CMOS technology. In this paper, the technique of body-drain connection is proposed and implemented. In this method, the parasitic diode is shorted and the threshold voltage of the MOSFET is modulated, improving the sensitivity. Compared to the inductor peaking method [1] and other mm-wave rectifiers [2][3] in CMOS technology, the circuit proposed in this paper achieves high sensitivity and efficiency while maintaining a compact size, because no inductors are used inside the rectifier. The work achieves the peak sensitivity at 52 GHz, providing a 1-V dc output voltage for an input power of -7 dBm. The overall sensitivity over the entire operational range of 50 - 60 GHz is below - 2 dBm.
Keywords
CMOS integrated circuits; MOS integrated circuits; diodes; inductors; millimetre wave integrated circuits; rectifiers; sensitivity; CMOS technology; DC output voltage; MOSFET; body-drain connection; compact size; efficiency; efficiency 8 percent; frequency 50 GHz to 60 GHz; inductor peaking method; inductors; mm-wave rectifiers; on-chip wireless-powered receiver; parasitic diode; peak sensitivity; rectifier sensitivity; size 65 nm; threshold voltage; voltage 1 V; CMOS integrated circuits; CMOS technology; Radio frequency; Receivers; Rectifiers; Semiconductor device modeling; Sensitivity; CMOS; energy harvesting; mm-wave; rectifier; wireless power transmission;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium (IMS), 2014 IEEE MTT-S International
Conference_Location
Tampa, FL
Type
conf
DOI
10.1109/MWSYM.2014.6848466
Filename
6848466
Link To Document