Title :
3D-susceptibility evaluation of actual housings of electronic equipment using rotating EM fields
Author :
Murano, Kimitoshi ; Tayarani, Majid ; Xiao, Fengchao ; Kami, Yoshio
Author_Institution :
Dept. of Commun. Eng., Tokai Univ., Kanagawa, Japan
Abstract :
The paper studies a method of evaluating the electromagnetic-shielding capability and three-dimensional susceptibility map for an actual electronic equipment housing. Although the shielding capability of an enclosure is conventionally evaluated using shielding effectiveness (SE), it is feared that the immunity/susceptibility weak points of the enclosure are overlooked. The susceptibility of an actual personal computer housing as an equipment under test (EUT) is measured using a rotating electromagnetic field. Experimental results show that the evaluation using susceptibility is more effective than the conventional SE. In addition, the test method is more effective in specifying the immunity/susceptibility weak points of the EUT visually and easily. Furthermore, it is shown that the condition of the incident EM field and the arrangement position of an EM-field sensor seriously affects the susceptibility of the actual housing.
Keywords :
electromagnetic fields; electromagnetic shielding; electronic equipment testing; immunity testing; packaging; 3D-susceptibility evaluation; electromagnetic-shielding capability; electronic equipment housing; immunity weak points; incident EM field; rotating EM fields; shielding effectiveness; susceptibility weak points; three-dimensional susceptibility map; Electric shock; Electromagnetic fields; Electromagnetic measurements; Electromagnetic radiation; Electronic equipment; Immunity testing; Microcomputers; Probes; Protection; Rotation measurement;
Conference_Titel :
Electromagnetic Compatibility, 2004. EMC 2004. 2004 InternationalSymposium on
Print_ISBN :
0-7803-8443-1
DOI :
10.1109/ISEMC.2004.1350002