DocumentCode :
1713771
Title :
Influence of metallic defects on the partial discharges at the interface between epoxy resin and silicone rubber
Author :
Onogi, M. ; Ohki, Y. ; Takahashi, Tatsuro ; Takahashi, Tatsuro ; Okamoto, Tatsuaki
Author_Institution :
Dept. of Electr. Eng. & Bioscience, Waseda Univ., Tokyo, Japan
Volume :
3
fYear :
2005
Firstpage :
560
Abstract :
We have proposed a concept of an all solid insulated substation system as a next generation substation from a viewpoint of environmental protection. In order to make the system compact and its layout flexible, a compact connection system with a soft insulating material and a hard one has to be developed. There is a high possibility that the dielectric strength of such a connection system is decreased when a metallic defect such as a wire exists at its interface. Thus, we prepared samples that imitate the interface of the connection system and measured partial discharge inception voltages (PDIV) in both cases that a metal wire was present or not at the interface. When we put the metal wire along the direction of electric field, the PDIV decreases significantly with an increase in the length of the wire, while it decreases a little when the wire is along the equipotential line. The presence of air at the interface also reduces the PDIV.
Keywords :
dielectric materials; electric fields; environmental management; epoxy insulation; partial discharge measurement; silicone rubber; substation insulation; dielectric strength; electric field; environmental protection; epoxy resin; metal wire; metallic defects; partial discharge inception voltages; silicone rubber; solid insulated substation system; Dielectric breakdown; Dielectric materials; Dielectric measurements; Dielectrics and electrical insulation; Epoxy resins; Partial discharges; Rubber; Solids; Substation protection; Wire;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Insulating Materials, 2005. (ISEIM 2005). Proceedings of 2005 International Symposium on
Print_ISBN :
4-88686-063-X
Type :
conf
DOI :
10.1109/ISEIM.2005.193430
Filename :
1496234
Link To Document :
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