• DocumentCode
    1713818
  • Title

    Experimental and modeling analysis of the reliability of the anisotropic conductive films

  • Author

    Yin, C.Y. ; Lu, H. ; Bailey, C. ; Chan, Y.C.

  • Author_Institution
    The University of Greenwich
  • fYear
    2003
  • Firstpage
    698
  • Lastpage
    702
  • Keywords
    Anisotropic conductive films; Anisotropic magnetoresistance; Assembly; Conductive adhesives; Contact resistance; Flip chip; Polymer films; Semiconductor device modeling; Stress; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 2003. Proceedings. 53rd
  • ISSN
    0569-5503
  • Print_ISBN
    0-7803-7791-5
  • Type

    conf

  • DOI
    10.1109/ECTC.2003.1216359
  • Filename
    1216359
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1713818