DocumentCode
1713848
Title
A roadmap to low cost flip chip and CSP using electroless Ni/Au
Author
Oppert, T. ; Zakel, E. ; Teutsch, T.
fYear
1998
Firstpage
106
Lastpage
113
Abstract
Flip chip (FC) technology is gaining an increased level of importance for a variety of applications based on flip chip on board or flip chip in package. The first driving force for the introduction of this technology was the need to achieve increased speed and performance along with higher I/O count. A breakthrough, however, will be the use of flip chip due to cost reduction. For this aim, it is essential to use low cost bumping techniques in combination with an SMT-compatible assembly method. The FC techniques presented in this paper are all based on an electroless Ni/Au bumping process which has been developed by TUB/IZM and implemented into production by Pac Tech. This paper shows a roadmap based on electroless nickel/gold bumping for all flip chip interconnection technologies currently used in industry. Also, the roadmap to future developments in the semiconductor industry based on 300 mm wafers and the use of new pad metallisations such as Cu is shown. The compatibility of electroless nickel bumping in particular with these new technologies to be implemented in wafer manufacturing in the next millenium shows that this key technology offers a roadmap to flip chip technology not only for products and wafer technologies in use at present but for next generation wafer technologies. This paper looks at electroless Ni as a basis for anisotropic conductive adhesive (ACF) flip chip assembly, for polymeric flip chip assembly (conductive adhesive) and for soldering and direct chip attach-type applications using different solder alloys
Keywords
chip scale packaging; conducting polymers; electroless deposition; flip-chip devices; gold; integrated circuit bonding; integrated circuit interconnections; integrated circuit metallisation; microassembling; nickel; polymer films; soldering; technological forecasting; 300 mm; CSP; Cu; Cu pad metallisations; FC techniques; Ni-Au; SMT-compatible assembly method; anisotropic conductive adhesive flip chip assembly; conductive adhesive; direct chip attach; electroless Ni; electroless Ni/Au; electroless Ni/Au bumping process; electroless nickel bumping; electroless nickel/gold bumping; flip chip; flip chip cost reduction; flip chip in package; flip chip interconnection technology; flip chip on board; flip chip technology; flip chip technology roadmap; low cost bumping techniques; package I/O count; package cost; polymeric flip chip assembly; semiconductor industry; solder alloys; soldering; technology roadmap; wafer manufacturing; wafer size; Assembly; Chip scale packaging; Conductive adhesives; Costs; Electronics industry; Flip chip; Gold; Manufacturing industries; Nickel; Production;
fLanguage
English
Publisher
ieee
Conference_Titel
IEMT/IMC Symposium, 2nd 1998
Conference_Location
Tokyo
Print_ISBN
0-7803-5090-1
Type
conf
DOI
10.1109/IEMTIM.1998.704534
Filename
704534
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