• DocumentCode
    1713885
  • Title

    The geometry effects of the ditched dielectric in AC-PDP cell

  • Author

    Shin, Y.K. ; Shon, C.H. ; Kim, W. ; Lee, J.K.

  • Author_Institution
    Dept. of Phys., Pohang Univ. of Sci. & Technol., South Korea
  • fYear
    1999
  • Firstpage
    243
  • Abstract
    Summary form only given. We present the cell-geometry effects with a fluid code in AC-PDP cell. The fluid code consists of the continuity equation and Poisson equation, and an equation for dielectric charging. The coplanar-electrode geometry is widely used because of the easiness of manufacturing and driving circuit. The luminance efficiency in the coplanar geometry is low because the dielectric layer deposited above the electrodes reduces the electric fields between the adjacent electrodes. Because the strong electric fields exist inside the dielectric layer, the reduced electric field does not generate effectively the plasma particles. We present the cell geometry with a ditched dielectric between the adjacent electrodes. This geometry uses the strong electric field in the ditched region. The plasma densities are increased and the discharge ignition time is decreased due to the strong electric field. The area and shape of the ditched region are discussed.
  • Keywords
    Poisson equation; dielectric materials; plasma density; plasma diagnostics; plasma dielectric properties; plasma simulation; AC-PDP cell; Poisson equation; adjacent electrodes; cell-geometry effects; continuity equation; coplanar geometry; coplanar-electrode geometry effects; dielectric charging; dielectric layer; discharge ignition time; ditched dielectric; ditched region; ditched region area; ditched region shape; fluid code; luminance efficiency; plasma densities; reduced electric field; Circuits; Dielectrics; Electrodes; Geometry; Ignition; Manufacturing; Plasma density; Plasma materials processing; Poisson equations; Shape;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Plasma Science, 1999. ICOPS '99. IEEE Conference Record - Abstracts. 1999 IEEE International Conference on
  • Conference_Location
    Monterey, CA, USA
  • ISSN
    0730-9244
  • Print_ISBN
    0-7803-5224-6
  • Type

    conf

  • DOI
    10.1109/PLASMA.1999.829564
  • Filename
    829564