DocumentCode :
1713932
Title :
Computer simulation of field emission devices with focusing structure
Author :
Lan, Y.C. ; Chen, S.H. ; Tsai, J.H. ; Lin, T.L. ; Hu, Y. ; Lai, J.T. ; Lin, C.M. ; Wan, C.H. ; Wang, W.C.
Author_Institution :
Nat. Center for High-Performance Comput., Hsinchu, South Korea
fYear :
1999
Firstpage :
244
Abstract :
Summary form only given. Beam focusing is a crucial technique for promoting the resolution of the field-emission displays. Various focusing structures for the Spindt-type field emission device have been proposed and applied on previous works, e.g. coaxial-type focusing, coplanar-type focusing (Kesling et al., 1995), ridge-type focusing and mesh-electrode focusing. The diamond-film coating provides another possibility to design new types of field emission devices with inherently smaller beam size. The planar-type and concave-lens-type cathodes are examples. In this study, diamond-film-coated field emitters with different emitting shapes are proposed and simulated by the MAGIC particle-in-cell code (Goplen et al., 1997). The focusing effect inherent in the emitting shape will be characterized and analyzed. The traditional Spindt-type devices with various focusing structures are also studied for comparisons. The electron trajectories, the spot sizes of beams, and the I-V curves are investigated systematically for each device.
Keywords :
cathodes; diamond; digital simulation; field emission; focusing; plasma simulation; I-V curves; MAGIC particle-in-cell code; Spindt-type devices; Spindt-type field emission device; beam focusing; beam size; coaxial-type focusing; computer simulation; concave-lens-type cathodes; coplanar-type focusing; diamond film coating; diamond-film-coated field emitters; electron trajectories; emitting shapes; field emission devices; field-emission displays.; focusing structure; focusing structures; mesh-electrode focusing; resolution; ridge-type focusing; spot sizes; Computer simulation; Electric variables measurement; Plasma density; Plasma devices; Plasma displays; Plasma measurements; Plasma properties; Plasma simulation; Probes; Shape;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Plasma Science, 1999. ICOPS '99. IEEE Conference Record - Abstracts. 1999 IEEE International Conference on
Conference_Location :
Monterey, CA, USA
ISSN :
0730-9244
Print_ISBN :
0-7803-5224-6
Type :
conf
DOI :
10.1109/PLASMA.1999.829566
Filename :
829566
Link To Document :
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