Multiple fault testing in analog circuits

Analog circuit testing is considered to be a very difficult task. This difficulty is mainly due to the lack of fault models and accessibility to internal nodes. To overcome this problem, an approach is presented for analog circuit testing. The testability of the circuit is analyzed by the multiple fault model and by functional testing. Component deviations are deduced by measuring a number of output parameters, and through sensitivity analysis and tolerance computation. Using this approach, adequate tests are identified for testing catastrophic and soft faults. Some experimental results are presented