The design of analog self-checking circuits

Author

Vinnakota, Bapiraju ; Harjani, Ramesh

Author_Institution

Dept. of Electr. Eng., Minnesota Univ., Minneapolis, MN, USA

fYear

1994

Firstpage

67

Lastpage

70

Abstract

In this paper we introduce a new class of analog circuits, self-checking analog circuits. We develop and discuss methods to design members of this new class. We target the class of fully differential analog circuits and use the inherent dual-rail code to develop self-checking circuits. We describe the design of a self-checking operational amplifier and the associated subcircuits. Our methodology has wide application as many analog circuits already are or can be transformed into fully differential circuits

Keywords

analogue circuits; circuit analysis computing; design for testability; differential amplifiers; linear integrated circuits; mixed analogue-digital integrated circuits; operational amplifiers; circuit simulation; differential analog code; fully differential analog circuits; inherent dual-rail code; mixed signal ICs; online error detection; redesign-for-reliability; self-checking analog circuits; self-checking circuit design; self-checking operational amplifier; Analog circuits; Circuit faults; Circuit testing; Design methodology; Digital systems; Electrical fault detection; Error correction; Fault detection; Filters; Logic circuits;

fLanguage

English

Publisher

ieee

Conference_Titel

VLSI Design, 1994., Proceedings of the Seventh International Conference on

Conference_Location

Calcutta

ISSN

1063-9667

Print_ISBN

0-8186-4990-9

Type

conf

DOI

10.1109/ICVD.1994.282658

Filename

282658