• DocumentCode
    1714112
  • Title

    International web course on mixed signal IC test

  • Author

    Kim, Bruce C. ; Varadarajan, Vijay ; Park, Se-Hyun

  • Author_Institution
    Arizona State University
  • fYear
    2003
  • Firstpage
    770
  • Lastpage
    772
  • Keywords
    Circuit testing; Electronic equipment testing; Electronics packaging; IEEE news; Integrated circuit noise; Integrated circuit testing; Mixed analog digital integrated circuits; Portals; Streaming media; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 2003. Proceedings. 53rd
  • ISSN
    0569-5503
  • Print_ISBN
    0-7803-7791-5
  • Type

    conf

  • DOI
    10.1109/ECTC.2003.1216372
  • Filename
    1216372
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1714112