DocumentCode :
1714347
Title :
Microstructural and performance implications of gold in Su-Ag-Cu-Sb interconnections
Author :
Peng, Weiqun ; Dunford, Steve ; Viswanadham, Puligandla ; Quander, Stephen
Author_Institution :
Nokia Corporation
fYear :
2003
Firstpage :
809
Lastpage :
815
Keywords :
Assembly; Ceramics; Environmentally friendly manufacturing techniques; Gold; Intermetallic; Lead; Microstructure; Soldering; Temperature; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 2003. Proceedings. 53rd
ISSN :
0569-5503
Print_ISBN :
0-7803-7791-5
Type :
conf
DOI :
10.1109/ECTC.2003.1216382
Filename :
1216382
Link To Document :
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