DocumentCode
1714401
Title
Tin Whisker formation - results, test methods and countermeasures
Author
Dittes, M. ; Obemdorff, P. ; Petit, L.
Author_Institution
Infineon Technologies
fYear
2003
Firstpage
822
Lastpage
826
Keywords
Compressive stress; Copper; Crystalline materials; Environmentally friendly manufacturing techniques; Lead compounds; Optical microscopy; Safety; Scanning electron microscopy; Testing; Tin alloys;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference, 2003. Proceedings. 53rd
ISSN
0569-5503
Print_ISBN
0-7803-7791-5
Type
conf
DOI
10.1109/ECTC.2003.1216384
Filename
1216384
Link To Document