Title :
Tin Whisker formation - results, test methods and countermeasures
Author :
Dittes, M. ; Obemdorff, P. ; Petit, L.
Author_Institution :
Infineon Technologies
Keywords :
Compressive stress; Copper; Crystalline materials; Environmentally friendly manufacturing techniques; Lead compounds; Optical microscopy; Safety; Scanning electron microscopy; Testing; Tin alloys;
Conference_Titel :
Electronic Components and Technology Conference, 2003. Proceedings. 53rd
Print_ISBN :
0-7803-7791-5
DOI :
10.1109/ECTC.2003.1216384
