Title :
Broadband characterization of dielectric materials from RF, millimeter-wave to THz frequencies accounting for anisotropy
Author :
Massenot, S. ; Bajon, D. ; Wane, S. ; Leyssenne, L. ; Coq-Germanicus, Rosine ; Descamps, Philippe
Author_Institution :
ISAE, Univ. de Toulouse, Toulouse, France
Abstract :
In this paper, experimental characterization of dielectric materials from RF, mm-Wave to THz frequencies accounting for Anisotropy is presented. Broadband extraction of complex permittivity values and dissipation factors for various materials is proposed. A more specific focus is particularly done on a Liquid crystal Polymer (LCP) and passive components on BiCMOS technology with Deep-Trench-Insulator patterns (DTI). Perspectives for the derivation of scalable broadband models fulfilling Kramers-Kronig relationships for use in Time-Domain and Frequency-Domain modeling analysis are drawn.
Keywords :
Kramers-Kronig relations; frequency-domain analysis; liquid crystal polymers; millimetre waves; permittivity; time-domain analysis; BiCMOS technology; Kramers-Kronig relationship; LCP; RF waves; THz frequency accounting; anisotropy effect; broadband extraction; broadband model derivation; complex permittivity; deep-trench-insulator patterns; dielectric materials; dissipation factors; frequency-domain modeling analysis; liquid crystal polymer; millimeter-wave accounting; passive components; time-domain modeling analysis; Adaptation models; Anisotropic magnetoresistance; BiCMOS integrated circuits; Dielectric measurement; Dielectrics; Frequency measurement; Radio frequency; Complex permittivity measurements; Terahertz time domain spectroscopy; liquid crystal polymers;
Conference_Titel :
Microwave Symposium (IMS), 2014 IEEE MTT-S International
Conference_Location :
Tampa, FL
DOI :
10.1109/MWSYM.2014.6848525
