Title :
The effect of built-in current sensors (BICS) on operational and test performance [CMOS ICs]
Author :
Menon, Sankaran M. ; Malaiya, Yashwant K. ; Jayasumana, Anura P. ; Tong, Carol Q.
Author_Institution :
Dept. of Electr. Eng., Colorado State Univ., Fort Collins, CO, USA
Abstract :
Effects of built-in current sensors on IDDQ measurement as well as on the performance of the circuit under test are considered. Most of the Built-in Current Sensor designs transform the ground terminal of the circuit under test to a virtual ground. This causes increase in both propagation delay as well as IDDQ sampling time with increase in the number of gates, affecting both test as well as operational performance. The effect that the current sensor has on the operational and test performance is considered. Circuit partitioning may be used for overcoming the effects of BICS on IDDQ measurements as well as on the performance of the circuit under test
Keywords :
CMOS integrated circuits; built-in self test; integrated circuit testing; leakage currents; logic testing; CMOS IC; IDDQ measurement; IDDQ sampling time; built-in current sensors; circuit partitioning; circuit under test; fault detection; leakage currents; operational performance; propagation delay; stuck-at faults; test performance; virtual ground; Circuit faults; Circuit testing; Current measurement; Electrical fault detection; Fault detection; Leak detection; Leakage current; Logic testing; Performance evaluation; Sensor phenomena and characterization;
Conference_Titel :
VLSI Design, 1994., Proceedings of the Seventh International Conference on
Conference_Location :
Calcutta
Print_ISBN :
0-8186-4990-9
DOI :
10.1109/ICVD.1994.282682
