The effect of built-in current sensors (BICS) on operational and test performance [CMOS ICs]

Author

Menon, Sankaran M. ; Malaiya, Yashwant K. ; Jayasumana, Anura P. ; Tong, Carol Q.

Author_Institution

Dept. of Electr. Eng., Colorado State Univ., Fort Collins, CO, USA

fYear

1994

Firstpage

187

Lastpage

190

Abstract

Effects of built-in current sensors on I_DDQ measurement as well as on the performance of the circuit under test are considered. Most of the Built-in Current Sensor designs transform the ground terminal of the circuit under test to a virtual ground. This causes increase in both propagation delay as well as I_DDQ sampling time with increase in the number of gates, affecting both test as well as operational performance. The effect that the current sensor has on the operational and test performance is considered. Circuit partitioning may be used for overcoming the effects of BICS on I_DDQ measurements as well as on the performance of the circuit under test

Keywords

CMOS integrated circuits; built-in self test; integrated circuit testing; leakage currents; logic testing; CMOS IC; I_DDQ measurement; I_DDQ sampling time; built-in current sensors; circuit partitioning; circuit under test; fault detection; leakage currents; operational performance; propagation delay; stuck-at faults; test performance; virtual ground; Circuit faults; Circuit testing; Current measurement; Electrical fault detection; Fault detection; Leak detection; Leakage current; Logic testing; Performance evaluation; Sensor phenomena and characterization;

fLanguage

English

Publisher

ieee

Conference_Titel

VLSI Design, 1994., Proceedings of the Seventh International Conference on

Conference_Location

Calcutta

ISSN

1063-9667

Print_ISBN

0-8186-4990-9

Type

conf

DOI

10.1109/ICVD.1994.282682

Filename

282682