• DocumentCode
    1714760
  • Title

    BER analysis of single-carrier MPAM in the presence of ADC quantization noise

  • Author

    Rizvi, Umar H. ; Janssen, Gerard J M ; Webe, Jos H.

  • Author_Institution
    Wireless & Mobile Commun. Group, Delft Univ. of Technol., Delft
  • fYear
    2008
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    Noisy radio frequency (RF) circuits tend to degrade the system performance, especially in high frequency communication systems. The performance analysis of such systems is normally based on Monte Carlo simulations which are rather time consuming and provide little insight for system performance bottle necks. In this paper, an exact closed form expression for the bit error rate (BER) of M-ary pulse amplitude modulated (MPAM) single carrier (SC) schemes as a function of analog to digital converter (ADC) word length is presented. This expression is then used for the performance evaluation of MPAM schemes perturbed by Gaussian and ADC quantization noise (QN) in various fading scenarios. The expressions presented can also be used to determine the system performance in the presence of other RF imperfections such as phase noise in addition to ADC noise and thus provide the system designer with a handy tool for RF system design and optimization.
  • Keywords
    Monte Carlo methods; analogue-digital conversion; error statistics; pulse amplitude modulation; ADC quantization noise; BER analysis; M-ary pulse amplitude modulation; Monte Carlo simulations; analog-digital converter word length; bit error rate; high frequency communication systems; optimization; radiofrequency circuits; single-carrier MPAM; Bit error rate; Circuit noise; Degradation; Neck; Performance analysis; Phase noise; Pulse modulation; Quantization; Radio frequency; System performance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Personal, Indoor and Mobile Radio Communications, 2008. PIMRC 2008. IEEE 19th International Symposium on
  • Conference_Location
    Cannes
  • Print_ISBN
    978-1-4244-2643-0
  • Electronic_ISBN
    978-1-4244-2644-7
  • Type

    conf

  • DOI
    10.1109/PIMRC.2008.4699779
  • Filename
    4699779