DocumentCode
1714857
Title
172 GHz divide-by-two circuit using a 0.25-µm InP HBT technology
Author
Monier, C. ; D´Amore, M. ; Scott, D. ; Cavus, A. ; Kaneshiro, E. ; Lin, S. ; Chang, P.C. ; Dang, L. ; Sato, K. ; Radisic, V. ; Truong, M. ; Nam, P. ; Pascua, D. ; Li, D. ; Chan, B. ; Sandhu, R. ; Wang, J. ; Oyama, B. ; Gutierrez, A. ; Oki, A.
Author_Institution
Northrop-Grumman Aerosp. Syst., Redondo Beach, CA
fYear
2009
Firstpage
24
Lastpage
27
Abstract
We report an advanced InP/InGaAs double heterojunction bipolar transistor technology using aggressive scaling in device layout and epitaxial stack. The device employs a 220 Aring highly doped base and a 1200 Aring collector designed to support current densities in excess of 12 mA/mum2. Transistors with emitter width of 0.25-mum have exhibited simultaneous measured f T and f max frequencies in the 500 GHz range. Frequency divide-by-two digital circuits designed and fabricated with this InP bipolar technology have demonstrated maximum clock frequency of 172 GHz. Manufacturing capabilities for mixed-signal circuits of increased complexity are also reported with improvements in resolution and bandwidth.
Keywords
III-V semiconductors; current density; gallium arsenide; heterojunction bipolar transistors; indium compounds; InP-InGaAs; aggressive scaling; current density; double heterojunction bipolar transistor technology; epitaxial stack; frequency 172 GHz; size 0.25 mum; Clocks; Current density; Digital circuits; Double heterojunction bipolar transistors; Frequency conversion; Frequency measurement; Heterojunction bipolar transistors; Indium gallium arsenide; Indium phosphide; Manufacturing;
fLanguage
English
Publisher
ieee
Conference_Titel
Indium Phosphide & Related Materials, 2009. IPRM '09. IEEE International Conference on
Conference_Location
Newport Beach, CA
ISSN
1092-8669
Print_ISBN
978-1-4244-3432-9
Electronic_ISBN
1092-8669
Type
conf
DOI
10.1109/ICIPRM.2009.5012410
Filename
5012410
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