DocumentCode
1714946
Title
Selective growth and chracterization of InGaAs Quantum Dots on patterned InP substrates utilizaing a diblock copolymer template
Author
Park, J.H. ; Kirch, J. ; Liu, C.C. ; Rathi, M.K. ; Mawst, L.J. ; Nealey, P.F. ; Kuech, T.F.
Author_Institution
Dept. of Electr. & Comput. Eng., Univ. of Wisconsin - Madison, Madison, WI
fYear
2009
Firstpage
52
Lastpage
54
Abstract
To realize the theoretical advantages of Quantum Dots (QDs) as the active region for diode lasers, the selective growth of QDs on patterned substrates were investigated. The substrate nanopatterning and QD formation was realized by diblock copolymers combined with selective MOCVD growth. Using a CF4 reactive ion etch (RIE) and a sacrificial SiNx mask, diblock copolymer nanopattern was transferred to InGaAs QDs on top of prepared InGaAsP / InP substrates and then QDs were grown selective ly by MOCVD. Since growth temperature of patterned QDs is free from QD formation mechanism, unlike self-assembled QDs, two samples were grown at relatively higher temperatures (550 degC and 630 degC) and a significant improvement in photoluminescence (PL) was observed from the sample grown at higher temperature.
Keywords
III-V semiconductors; MOCVD; gallium arsenide; gallium compounds; indium compounds; nanopatterning; photoluminescence; semiconductor growth; semiconductor quantum dots; CF4 reactive ion etch; InGaAsP-InP; InP substrates; diblock copolymer nanopattern; diode lasers; growth temperature; photoluminescence; quantum dot formation mechanism; sacrificial SiNx mask; selective MOCVD growth; self-assembled quantum dots; substrate nanopatterning; temperature 550 C; temperature 630 C; Diode lasers; Etching; Indium gallium arsenide; Indium phosphide; MOCVD; Nanopatterning; Quantum dot lasers; Quantum dots; Quantum mechanics; Temperature;
fLanguage
English
Publisher
ieee
Conference_Titel
Indium Phosphide & Related Materials, 2009. IPRM '09. IEEE International Conference on
Conference_Location
Newport Beach, CA
ISSN
1092-8669
Print_ISBN
978-1-4244-3432-9
Electronic_ISBN
1092-8669
Type
conf
DOI
10.1109/ICIPRM.2009.5012413
Filename
5012413
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