DocumentCode :
1714987
Title :
Characterization of the curing properties of no-flow underfill and B-stage feasibility study for wafer level application
Author :
Zhang, Zhuqing ; Wong, C.P.
Author_Institution :
Georgia Institute of Technology
fYear :
2003
Firstpage :
971
Lastpage :
977
Keywords :
Assembly; Curing; Delay; Kinetic theory; Material storage; Materials science and technology; Predictive models; Semiconductor device modeling; Soldering; Thermal stresses;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 2003. Proceedings. 53rd
ISSN :
0569-5503
Print_ISBN :
0-7803-7791-5
Type :
conf
DOI :
10.1109/ECTC.2003.1216408
Filename :
1216408
Link To Document :
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