DocumentCode :
1715057
Title :
Hybrid power modules using a metal matrix composite baseplate: An evaluation
Author :
Azzopardi, Stéphane ; Thébaud, Jean-Marc ; Woirgard, Eric ; Zardini, Christian
Author_Institution :
Bordeaux I Univ., Talence, France
fYear :
1998
Firstpage :
173
Lastpage :
178
Abstract :
This paper presents an evaluation of the reliability of hybrid power modules using a metal matrix composite baseplate. In this study, we investigate the possible damage in the assemblies by measuring their thermal resistance. Several 2"/spl times/1" power module samples including four bipolar transistors (BUX48) have been realized with the use of a vacuum bake soldering machine allowing reduction of voids in the solder joints. The test vehicles have been submitted to liquid-liquid thermal shocks (+125/spl deg/C/-55/spl deg/C). Every 250 thermal shocks, two samples were extracted in order to measure the thermal resistance. Results show that even after 2700 shocks, only a very small increase in the thermal resistance of the assemblies is observed. In comparison, modules with a copper baseplate show a strong increase in thermal resistance and fail much earlier. As a consequence, in applications where thermal cycling is involved, hybrid power modules with metal matrix composite baseplates will offer much better reliability. SEM observations conducted on cross-sectioned samples and acoustic analysis do not show the typical cracks generally observed in solder joints between the direct bonded copper substrate and the copper baseplate of aged modules.
Keywords :
acoustic analysis; ageing; aluminium; hybrid integrated circuits; modules; particle reinforced composites; power bipolar transistors; scanning electron microscopy; semiconductor device packaging; semiconductor device reliability; silicon compounds; soldering; thermal analysis; thermal resistance; thermal shock; thermal stresses; voids (solid); -55 to 125 C; 1 in; 2 in; Cu; SEM; SiC particle reinforced Al composite baseplate; SiC-Al; acoustic analysis; aged modules; bipolar transistors; copper baseplate; cracks; cross-sectioned samples; direct bonded copper substrate; early failure; hybrid power module damage; hybrid power modules; liquid-liquid thermal shocks; metal matrix composite baseplate; power modules; reliability; solder joint voids; solder joints; test vehicles; thermal cycling; thermal resistance; vacuum bake soldering machine; Assembly; Bipolar transistors; Copper; Electric shock; Electrical resistance measurement; Multichip modules; Soldering; Testing; Thermal resistance; Vehicles;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
IEMT/IMC Symposium, 2nd 1998
Conference_Location :
Tokyo, Japan
Print_ISBN :
0-7803-5090-1
Type :
conf
DOI :
10.1109/IEMTIM.1998.704558
Filename :
704558
Link To Document :
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