DocumentCode
1715089
Title
Investigation of the impact of conductor surface roughness on interconnect frequency-dependent ohmic loss
Author
Proekt, Leonid ; Cangellaris, Andreas C.
Author_Institution
University of Illinois
fYear
2003
Firstpage
1004
Lastpage
1010
Keywords
Conductivity; Conductors; Corrugated surfaces; Electromagnetic fields; Electromagnetic modeling; Frequency; Rough surfaces; Surface resistance; Surface roughness; Surface waves;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference, 2003. Proceedings. 53rd
ISSN
0569-5503
Print_ISBN
0-7803-7791-5
Type
conf
DOI
10.1109/ECTC.2003.1216412
Filename
1216412
Link To Document