DocumentCode :
1715390
Title :
Low-cost redundancy identification for combinational circuits
Author :
Iyer, Mahesh A. ; Abramovici, Miron
Author_Institution :
Dept. of Electr. & Comput. Eng., Illinois Inst. of Technol., Chicago, IL, USA
fYear :
1994
Firstpage :
315
Lastpage :
318
Abstract :
This paper presents a novel fault independent algorithm for redundancy identification (FIRE) in combinational circuits. The algorithm is based on a simple concept that a fault which requires an illegal combination of values as a necessary condition for its detection is undetectable and hence redundant. It uses implications to find a subset of such faults whose detection requires conflicts on certain lines in the circuit. Our results on benchmark circuits indicate that we find a large number of redundancies, much faster when compared to a test-generation-based approach for redundancy identification
Keywords :
combinatorial circuits; fault location; logic testing; redundancy; combinational circuits; fault independent algorithm; low-cost redundancy identification; Automatic testing; Benchmark testing; Circuit faults; Circuit testing; Combinational circuits; Electrical fault detection; Fault detection; Fault diagnosis; Logic circuits; Redundancy;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Design, 1994., Proceedings of the Seventh International Conference on
Conference_Location :
Calcutta
ISSN :
1063-9667
Print_ISBN :
0-8186-4990-9
Type :
conf
DOI :
10.1109/ICVD.1994.282710
Filename :
282710
Link To Document :
بازگشت