Title :
Characterization of power amplifiers using noise loading
Author_Institution :
AIL Syst. Inc., Deer Park, NY, USA
Abstract :
Noise power ratio (NPR) testing is a very powerful, yet simple way of determining the dynamic range and nonlinear properties of power amplifiers. It provides a quantitative assessment of spectral regrowth and gives insight into the power and efficiency capabilities of the amplifier under signal conditions that emulate those in the actual system. The authors present test results for a 10 W GaAs MESFET amplifier
Keywords :
MESFET integrated circuits; field effect analogue integrated circuits; integrated circuit noise; integrated circuit testing; nonlinear network analysis; power amplifiers; 10 W; GaAs; GaAs MESFET amplifier; dynamic range; noise loading; noise power ratio testing; nonlinear properties; power amplifiers; quantitative assessment; spectral regrowth; Bandwidth; Electromagnetic spectrum; Frequency division multiaccess; Hardware; Modems; Multiaccess communication; Power amplifiers; Quadrature amplitude modulation; Quadrature phase shift keying; Transmitters;
Conference_Titel :
ELECTRO '96. Professional Program. Proceedings.
Conference_Location :
Somerset, NJ
Print_ISBN :
0-7803-3271-7
DOI :
10.1109/ELECTR.1996.501243
