Title :
Linear circuits: A measurement based approach
Author :
Layek, Ritwik ; Datta, Aniruddha ; Bhattacharyya, Shankar P.
Author_Institution :
Dept. of Electr. & Comput. Eng., Texas A & M Univ., College Station, TX, USA
Abstract :
This paper reports a new measurement based approach that can be used to determine the functional dependence of a D.C. circuit variable of interest on a small set of design variables. The approach makes use of a small number of measurements and generalizes the well known Thévenin´s Theorem of circuit theory.
Keywords :
analogue circuits; DC circuit variable; Thevenin theorem; circuit theory; functional dependence; linear circuits; Current measurement; Electrical resistance measurement; Equations; Integrated circuit modeling; Linear circuits; Mathematical model; Resistance;
Conference_Titel :
Circuit Theory and Design (ECCTD), 2011 20th European Conference on
Conference_Location :
Linkoping
Print_ISBN :
978-1-4577-0617-2
Electronic_ISBN :
978-1-4577-0616-5
DOI :
10.1109/ECCTD.2011.6043390
