Title :
A W-band balun integrated probe with common mode matching network
Author :
Chunhu Zhang ; Bauwens, M. ; Barker, N.S. ; Weikle, Robert M. ; Lichtenberger, Arthur W.
Author_Institution :
Charles L. Brown Dept. of Electr. & Comput. Eng., Univ. of Virginia, Charlottesville, VA, USA
Abstract :
There has been a growing interest in developing differential Millimeter-wave Monolithic Integrated Circuits (MMICs) in recent years. The characterization infrastructure for these differential devices however, is still limited at higher frequencies. In this paper, a balun integrated probe is designed to cover the entire W-band (75 - 110 GHz) with the potential to be scaled to even higher frequencies. Test structures of the balun are characterized and found to agree well with simulated results for the entire W-band, while the balun integrated probe is characterized from 90 to 115 GHz, also agreeing well with simulation. Over the frequency range measured, the balun integrated probe has lower than -22 dB coupling between the single-ended input and common mode output, as well as between the common and differential modes. Furthermore, the return loss for the differential output and single-ended input modes are better than 10 dB, while the common mode return loss is also better than 10 dB.
Keywords :
MMIC; baluns; millimetre wave devices; MMIC; W-band balun integrated probe; common mode matching network; differential millimeter-wave monolithic integrated circuits; differential modes; frequency 75 GHz to 110 GHz; frequency 90 GHz to 115 GHz; frequency range measurement; single-ended input modes; Calibration; Impedance matching; Loss measurement; Ports (Computers); Probes; Resistors; Thickness measurement; balun integrated probe; common mode matching; differential circuits characterization;
Conference_Titel :
Microwave Symposium (IMS), 2014 IEEE MTT-S International
Conference_Location :
Tampa, FL
DOI :
10.1109/MWSYM.2014.6848601