Title :
Mixed-mode simulations for power system optimization
Author :
Trivedi, Mohan ; Shenai, Krishna
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Illinois Univ., Chicago, IL, USA
Abstract :
The next generation of power semiconductor devices will be designed and optimized at the application level. To develop an optimum power semiconductor device, there is a critical need to perform careful tradeoff among performance and reliability parameters of devices and circuits. Application specific device optimization renders necessary the development of a “mixed-mode” circuit simulation capability in which semiconductor carrier dynamics are studied and optimized in an actual circuit application environment. In this paper, safe operating area of IGBTs is studied using technology CAD (TCAD) tools beginning with process and device simulation and culminating in circuit-level switching simulations wherein the semiconductor equations are solved consistently with the circuit equations
Keywords :
CAD; circuit analysis computing; insulated gate bipolar transistors; power integrated circuits; power semiconductor devices; semiconductor device models; semiconductor device reliability; semiconductor process modelling; IGBTs; TCAD tools; application level; application specific device optimization; circuit application environment; circuit simulation; circuit-level switching simulations; device simulation; mixed-mode simulations; performance parameters; power semiconductor device optimization; process simulation; reliability parameters; safe operating area; semiconductor carrier dynamics; short circuit failure; technology CAD; virtual wafer fabrication; Circuit simulation; Design optimization; Equations; Power electronics; Power semiconductor devices; Power system reliability; Power system simulation; Semiconductor device manufacture; Semiconductor device reliability; Switching circuits;
Conference_Titel :
Microelectronics, 1997. Proceedings., 1997 21st International Conference on
Conference_Location :
Nis
Print_ISBN :
0-7803-3664-X
DOI :
10.1109/ICMEL.1997.632867