Title :
Progress and challenges in the direct monolithic integration of III–V devices and Si CMOS on silicon substrates
Author :
Kazior, T.E. ; Laroche, J.R. ; Lubyshev, D. ; Fastenau, J.M. ; Liu, W.K. ; Urteaga, M. ; Ha, W. ; Bergman, J. ; Choe, M.J. ; Bulsara, M.T. ; Fitzgerald, E.A. ; Smith, D. ; Clark, D. ; Thompson, R. ; Drazek, C. ; Daval, N. ; Benaissa, L. ; Augendre, E.
Author_Institution :
Raytheon Integrated Defense Syst., Andover, MA
Abstract :
We present results on the direct monolithic integration of III-V devices and Si CMOS on a silicon substrate. Through optimization of device fabrication and material growth processes III-V devices with electrical performance comparable to devices grown on native III-V substrates were grown directly in windows adjacent to CMOS transistors on silicon template wafers or SOLES (Silicon on Lattices Engineered Substrates). While the results presented here are for InP HBTs, our direct heterogeneously integration approach is equally applicable to other III-V electronic (FETs, HEMTs) and opto-electronic (photodiodes, VSCLS) devices and opens the door to a new class of highly integrated, high performance, mixed signal circuits.
Keywords :
CMOS integrated circuits; III-V semiconductors; elemental semiconductors; heterojunction bipolar transistors; indium compounds; monolithic integrated circuits; optimisation; semiconductor growth; silicon; substrates; CMOS transistors; FET; HBTs; III-V devices; InP; SOLES; Si; VSCLS; direct monolithic integration; electrical properties; mixed signal circuits; optimization; photodiodes; silicon on lattices engineered substrates; silicon substrates; silicon template wafers; CMOS process; FETs; Fabrication; HEMTs; III-V semiconductor materials; Indium phosphide; Lattices; MODFETs; Monolithic integrated circuits; Silicon; CMOS integrated circuits; Heterojunction bipolar transistors; Indium Phosphide; Monolithic integrated circuits; Silicon;
Conference_Titel :
Indium Phosphide & Related Materials, 2009. IPRM '09. IEEE International Conference on
Conference_Location :
Newport Beach, CA
Print_ISBN :
978-1-4244-3432-9
Electronic_ISBN :
1092-8669
DOI :
10.1109/ICIPRM.2009.5012452