Title :
USB Validation Challenges on C45SOI & C28NM Technology Products
Author :
Pandey, Maneesh Kumar ; Gupta, Arpan ; Shekhar, Shashi
Author_Institution :
Digital Networking, Free scale Semicond. India Pvt. Ltd., Noida, India
Abstract :
With shrinking technologies, high speed design such as USB starts giving all sort of problem. The issues which come due to aforesaid reason are difficult to debug, analyze and root-cause. The traditional USB Validation approach is unable to discover all the issues leading to customer reject. With inclusion of aggressive new test cases in Validation plan under the umbrella of "Firmware based Validation" numerous issues were caught in USB design. The complex issues of USB caught and elegant solution to those problems are described in this paper as case studies.
Keywords :
firmware; system buses; C28NM technology products; C45SOI technology products; USB design; USB validation approach; USB validation challenges; firmware based validation; high speed design; shrinking technologies; Clocks; Delays; Jitter; Microprogramming; Robustness; Testing; Universal Serial Bus; C28nm; C45SOI; Firmware; Validation;
Conference_Titel :
Microprocessor Test and Verification (MTV), 2013 14th International Workshop on
Conference_Location :
Austin, TX
DOI :
10.1109/MTV.2013.12