DocumentCode
1716591
Title
Three-dimensional nanosprings for electromechanical sensors
Author
Bell, D.J. ; Sun, Y. ; Zhang, L. ; Dong, L.X. ; Nelson, E.J. ; Grützmacher, D.
Author_Institution
Swiss Fed. Inst. of Technol., Zurich, Switzerland
Volume
1
fYear
2005
Firstpage
15
Abstract
This paper presents the use of a novel fabrication technique to make three-dimensional nanostructures with nanoscale features that can be used for electromechanical sensors. The process uses conventional microfabrication techniques to create a planar pattern in a SiGe/Si bilayer that then self-assembles into three-dimensional (3D) structures during a wet etch release. An additional metal layer is integrated for higher conductivity. Results from the fabrication of the structures are demonstrated. Nanomanipulation inside an SEM was conducted to probe the structures for mechanical and electrical characterization. The experimental characterization results were validated by finite element simulation results.
Keywords
Ge-Si alloys; finite element analysis; microsensors; nanotechnology; self-assembly; 3D structures; Ga-Si; SiGe/Si bilayer; conductivity; electromechanical sensors; finite element simulation; microfabrication; nanomanipulation; nanoscale features; planar pattern; self-assembly; three-dimensional nanosprings; three-dimensional nanostructures; three-dimensional structures; wet etch release; Conductivity; Electromechanical sensors; Fabrication; Germanium silicon alloys; Nanostructures; Numerical analysis; Probes; Self-assembly; Silicon germanium; Wet etching;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Sensors, Actuators and Microsystems, 2005. Digest of Technical Papers. TRANSDUCERS '05. The 13th International Conference on
Print_ISBN
0-7803-8994-8
Type
conf
DOI
10.1109/SENSOR.2005.1496347
Filename
1496347
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