• DocumentCode
    17166
  • Title

    IGZO TFT-Based All-Enhancement Operational Amplifier Bent to a Radius of 5 mm

  • Author

    Zysset, Christoph ; Munzenrieder, N. ; Petti, L. ; Buthe, L. ; Salvatore, G.A. ; Troster, G.

  • Author_Institution
    Inst. for Electron., Swiss Fed. Inst. of Technol. Zurich, Zürich, Switzerland
  • Volume
    34
  • Issue
    11
  • fYear
    2013
  • fDate
    Nov. 2013
  • Firstpage
    1394
  • Lastpage
    1396
  • Abstract
    An all-enhancement operational amplifier operating at 5 V and comprising 16 n-type amorphous indium-gallium-zinc-oxide thin-film transistors (TFTs) is fabricated on a 50 μm thick flexible polyimide substrate. The operational amplifier has an open loop voltage gain of 18.7 dB and a unity-gain frequency of 472 kHz while the common-mode rejection ratio (CMMR) is larger than 40 dB. The mechanical flexibility of the amplifier is demonstrated by bending the circuit to a radius of 5 mm, which corresponds to a tensile strain of 0.5% parallel to the TFT channels. The bent amplifier shows the same output behavior as when flat. The power consumption of the operational amplifier is 900 μW, regardless whether the circuit is flat or bent.
  • Keywords
    amorphous semiconductors; gallium compounds; indium compounds; internal stresses; operational amplifiers; thin film transistors; zinc compounds; IGZO TFT-based all-enhancement operational amplifier; InGaZnO; amorphous indium-gallium- zinc-oxide thin-film transistors; common-mode rejection ratio; frequency 472 kHz; gain 18.7 dB; mechanical flexibility; open loop voltage gain; power 900 muW; power consumption; radius 5 mm; size 50 mum; tensile strain; thick flexible polyimide substrate; unity-gain frequency; voltage 5 V; Frequency measurement; Gain; Strain; Substrates; Thin film transistors; Voltage measurement; Analog circuits; indium–gallium-zinc–oxide (IGZO); operational amplifiers; thin-film circuits; thin-film transistors (TFTs);
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/LED.2013.2280024
  • Filename
    6605493