Title :
Analyzing Efficacy of Constrained Test Program Generators - A Case Study
Author :
Kamath, Vinayak ; Rahman, Farin ; Wang, L.-C.
Author_Institution :
Univ. of California Santa Barbara, Santa Barbara, CA, USA
Abstract :
Functional verification of microprocessor designs exposes bugs in the design implementation by using a vast suite of randomly generated and directed test programs. Typically, more than one random test program generator(exerciser) is used. Our objective here is to develop a methodology to assess exerciser verification efficiency qualitatively and quantitatively. This understanding is used to identify untested design properties and fix coverage holes. We demonstrate this using a comparative analysis of the abilities of two in-house exercisers based to verify secure virtual mode(SVM) functionalities of an x86 instruction set architecture-based microprocessor core. We demonstrate that simulation data can be used to provide feedback on verification completeness to increase functional coverage.
Keywords :
formal verification; instruction sets; multiprocessing systems; SVM functionalities; constrained test program generators; exerciser verification efficiency; functional verification; instruction set architecture-based microprocessor core; secure virtual mode; Computer bugs; Data models; Measurement; Microprocessors; Support vector machines; Switches; Table lookup; RTPG; RTPG comparison; coverage; design verification; exerciser comparison; exercisers; functional coverage; functional verification; random test program generators;
Conference_Titel :
Microprocessor Test and Verification (MTV), 2013 14th International Workshop on
Conference_Location :
Austin, TX
DOI :
10.1109/MTV.2013.30