Title :
High precision measurement method for dielectric film materials by a novel V band cavity resonator
Author :
Shimizu, Tsuyoshi ; Kogami, Yoshinori
Author_Institution :
Grad. Sch. of Eng., Utsunomiya Univ., Yoto, Japan
Abstract :
Many millimeter wave circuit designers require complex permittivity of low εr film materials with excellent characteristics. However, there are few accuracy measurement methods for film materials in millimeter wave region. In this paper, a high precision measurement method for dielectric film materials in 60GHz band are proposed on the basis of a cavity resonator method. The measured results validate the accuracy and the usefulness of the proposed method and newly developed V band cavity.
Keywords :
cavity resonators; dielectric materials; dielectric thin films; millimetre wave circuits; millimetre wave materials; millimetre wave measurement; millimetre wave resonators; permittivity measurement; V band cavity resonator; accuracy measurement method; complex permittivity measurement; dielectric film materials; frequency 60 GHz; millimeter wave circuit design; precision measurement method; Films; Cavity resonator method; Complex permittivity; Low-loss dielectric materials; Millimeter-wave;
Conference_Titel :
Microwave Symposium (IMS), 2014 IEEE MTT-S International
Conference_Location :
Tampa, FL
DOI :
10.1109/MWSYM.2014.6848636
