High precision measurement method for dielectric film materials by a novel V band cavity resonator

Author

Shimizu, Tsuyoshi ; Kogami, Yoshinori

Author_Institution

Grad. Sch. of Eng., Utsunomiya Univ., Yoto, Japan

fYear

2014

fDate

1-6 June 2014

Firstpage

1

Lastpage

3

Abstract

Many millimeter wave circuit designers require complex permittivity of low ε_r film materials with excellent characteristics. However, there are few accuracy measurement methods for film materials in millimeter wave region. In this paper, a high precision measurement method for dielectric film materials in 60GHz band are proposed on the basis of a cavity resonator method. The measured results validate the accuracy and the usefulness of the proposed method and newly developed V band cavity.

Keywords

cavity resonators; dielectric materials; dielectric thin films; millimetre wave circuits; millimetre wave materials; millimetre wave measurement; millimetre wave resonators; permittivity measurement; V band cavity resonator; accuracy measurement method; complex permittivity measurement; dielectric film materials; frequency 60 GHz; millimeter wave circuit design; precision measurement method; Films; Cavity resonator method; Complex permittivity; Low-loss dielectric materials; Millimeter-wave;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwave Symposium (IMS), 2014 IEEE MTT-S International

Conference_Location

Tampa, FL

Type

conf

DOI

10.1109/MWSYM.2014.6848636

Filename

6848636