DocumentCode :
1716620
Title :
State Retention Validation of C66X DSP Core
Author :
Venkatasubramanian, Ramakrishnan ; Olorode, Oluleye ; Arun, Abhishek
Author_Institution :
Multicore & DSP Dev. Group, Texas Instrum., Dallas, TX, USA
fYear :
2013
Firstpage :
106
Lastpage :
111
Abstract :
Low power design has become an important design requirement in any deep-submicron CMOS design development. State retention using retention flip flops is one of the low power techniques that offer the ability to save and restore the state of the design during a period of inactivity (IDLE or STANDBY mode). Since processor cores typically have a well-defined period of operation and inactivity, the state retention scheme is well suited for processor designs. This paper provides an overview of the various state retention implementation choices for processor cores and explains the state retention validation methodology for the different implementations. The state retention and validation methodology deployed for the TI C66x Core is explained in detail.
Keywords :
CMOS integrated circuits; digital signal processing chips; flip-flops; logic design; low-power electronics; C66X DSP core; TI C66x core; deep-submicron CMOS design development; design requirement; low power design; low power techniques; processor cores; processor designs; retention flip flops; state retention validation; Clocks; Computer architecture; Digital signal processing; Libraries; Microprocessors; Sequential analysis; Standards; Low power; State retention;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microprocessor Test and Verification (MTV), 2013 14th International Workshop on
Conference_Location :
Austin, TX
ISSN :
1550-4093
Type :
conf
DOI :
10.1109/MTV.2013.31
Filename :
6926111
Link To Document :
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