• DocumentCode
    1716620
  • Title

    State Retention Validation of C66X DSP Core

  • Author

    Venkatasubramanian, Ramakrishnan ; Olorode, Oluleye ; Arun, Abhishek

  • Author_Institution
    Multicore & DSP Dev. Group, Texas Instrum., Dallas, TX, USA
  • fYear
    2013
  • Firstpage
    106
  • Lastpage
    111
  • Abstract
    Low power design has become an important design requirement in any deep-submicron CMOS design development. State retention using retention flip flops is one of the low power techniques that offer the ability to save and restore the state of the design during a period of inactivity (IDLE or STANDBY mode). Since processor cores typically have a well-defined period of operation and inactivity, the state retention scheme is well suited for processor designs. This paper provides an overview of the various state retention implementation choices for processor cores and explains the state retention validation methodology for the different implementations. The state retention and validation methodology deployed for the TI C66x Core is explained in detail.
  • Keywords
    CMOS integrated circuits; digital signal processing chips; flip-flops; logic design; low-power electronics; C66X DSP core; TI C66x core; deep-submicron CMOS design development; design requirement; low power design; low power techniques; processor cores; processor designs; retention flip flops; state retention validation; Clocks; Computer architecture; Digital signal processing; Libraries; Microprocessors; Sequential analysis; Standards; Low power; State retention;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microprocessor Test and Verification (MTV), 2013 14th International Workshop on
  • Conference_Location
    Austin, TX
  • ISSN
    1550-4093
  • Type

    conf

  • DOI
    10.1109/MTV.2013.31
  • Filename
    6926111