DocumentCode
1716620
Title
State Retention Validation of C66X DSP Core
Author
Venkatasubramanian, Ramakrishnan ; Olorode, Oluleye ; Arun, Abhishek
Author_Institution
Multicore & DSP Dev. Group, Texas Instrum., Dallas, TX, USA
fYear
2013
Firstpage
106
Lastpage
111
Abstract
Low power design has become an important design requirement in any deep-submicron CMOS design development. State retention using retention flip flops is one of the low power techniques that offer the ability to save and restore the state of the design during a period of inactivity (IDLE or STANDBY mode). Since processor cores typically have a well-defined period of operation and inactivity, the state retention scheme is well suited for processor designs. This paper provides an overview of the various state retention implementation choices for processor cores and explains the state retention validation methodology for the different implementations. The state retention and validation methodology deployed for the TI C66x Core is explained in detail.
Keywords
CMOS integrated circuits; digital signal processing chips; flip-flops; logic design; low-power electronics; C66X DSP core; TI C66x core; deep-submicron CMOS design development; design requirement; low power design; low power techniques; processor cores; processor designs; retention flip flops; state retention validation; Clocks; Computer architecture; Digital signal processing; Libraries; Microprocessors; Sequential analysis; Standards; Low power; State retention;
fLanguage
English
Publisher
ieee
Conference_Titel
Microprocessor Test and Verification (MTV), 2013 14th International Workshop on
Conference_Location
Austin, TX
ISSN
1550-4093
Type
conf
DOI
10.1109/MTV.2013.31
Filename
6926111
Link To Document