X-ray and EUV diagnostics for the Nevada Terawatt Facility: plasma imaging, spectroscopy, and polarimetry

Summary form only given. A wide variety of advanced extreme ultraviolet (EUV) and X-ray diagnostics are being developed for the Nevada Terawatt Facility (NTF) at the University of Nevada, Reno. Time-resolved short-wavelength imaging, backlighting, imaging spectroscopy, and polarization spectroscopy will be employed to measure profiles of plasma temperature, density, flow, charge state, and magnetic field. The instruments are state-of-the-art applications of glass capillary converters (GCC), multilayer mirrors (MLM), and crystals. The devices include: a prototype of a new glass-capillary-based two-dimensional imaging spectrometer; a pinhole camera with 6 MCP imagers; a 5-channel crystal/MLM spectrometer ("Polychromator") with fast X-ray diodes and an added transmission grating spectrometer; a convex-crystal X-ray survey spectrometer; a prototype of an X-ray polarimeter/spectrometer; and a multiframe X-pinch backlighter yielding point-projection microscopy with few-micron, sub-ns resolution. Spectroscopic data will be interpreted with state-of-the-art spectral calculations that take into account line intensity, plasma broadening, opacity, and polarization effects, for both resonance and satellite lines. Emission spectroscopy will be used to measure plasma density and temperature in the hot plasma around exploding wires, with polarization measurements helping to determine the electron distribution function and the magnetic field in this region. The density and temperature of the high-density, low-temperature plasma inside exploding Al wires will be measured with absorption spectroscopy.