DocumentCode :
1716808
Title :
Fundamental oscillation up TO 831 GHz in GaInAs/AlAs resonant tunneling diode
Author :
Suzuki, S. ; Teranishi, A. ; Hinata, K. ; Asada, M. ; Sugiyama, H. ; Yokoyama, H.
Author_Institution :
Interdiscipl. Grad. Sch. of Sci. & Eng., Tokyo Inst. of Technol., Tokyo
fYear :
2009
Firstpage :
192
Lastpage :
195
Abstract :
A fundamental oscillation of up to 831 GHz was observed at room temperature in GaInAs/AlAs resonant tunneling diodes integrated with planar slot antennas. The thickness of the collector spacer layer was optimized (20 nm) and the mesa area (<1 mum2) was reduced in order to reduce the resonant tunneling diode capacitance. Reduction in the negative differential conductance in the small mesa area was prevented by increasing the emitter doping concentration (3 times 1018 cm-3) which resulted in an ultra-high peak current density (18 mA/mum2) with a peak-to-valley current ratio of 2. The dependence of oscillation frequency on the mesa area was also studied. The output power was at least 1 muW.
Keywords :
III-V semiconductors; aluminium compounds; current density; doping profiles; gallium compounds; indium compounds; resonant tunnelling diodes; semiconductor doping; slot antennas; GaInAs-AlAs; collector spacer layer; emitter doping concentration; frequency 831 GHz; mesa area; negative differential conductance; oscillation frequency; output power; peak-to-valley current ratio; planar slot antennas; power 1 muW; resonant tunneling diode; size 20 nm; ultrahigh peak current density; Capacitance; Current density; Diodes; Doping; Electrodes; Frequency; Gold; Oscillators; Resonant tunneling devices; Slot antennas;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Indium Phosphide & Related Materials, 2009. IPRM '09. IEEE International Conference on
Conference_Location :
Newport Beach, CA
ISSN :
1092-8669
Print_ISBN :
978-1-4244-3432-9
Electronic_ISBN :
1092-8669
Type :
conf
DOI :
10.1109/ICIPRM.2009.5012476
Filename :
5012476
Link To Document :
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