DocumentCode
1716808
Title
Fundamental oscillation up TO 831 GHz in GaInAs/AlAs resonant tunneling diode
Author
Suzuki, S. ; Teranishi, A. ; Hinata, K. ; Asada, M. ; Sugiyama, H. ; Yokoyama, H.
Author_Institution
Interdiscipl. Grad. Sch. of Sci. & Eng., Tokyo Inst. of Technol., Tokyo
fYear
2009
Firstpage
192
Lastpage
195
Abstract
A fundamental oscillation of up to 831 GHz was observed at room temperature in GaInAs/AlAs resonant tunneling diodes integrated with planar slot antennas. The thickness of the collector spacer layer was optimized (20 nm) and the mesa area (<1 mum2) was reduced in order to reduce the resonant tunneling diode capacitance. Reduction in the negative differential conductance in the small mesa area was prevented by increasing the emitter doping concentration (3 times 1018 cm-3) which resulted in an ultra-high peak current density (18 mA/mum2) with a peak-to-valley current ratio of 2. The dependence of oscillation frequency on the mesa area was also studied. The output power was at least 1 muW.
Keywords
III-V semiconductors; aluminium compounds; current density; doping profiles; gallium compounds; indium compounds; resonant tunnelling diodes; semiconductor doping; slot antennas; GaInAs-AlAs; collector spacer layer; emitter doping concentration; frequency 831 GHz; mesa area; negative differential conductance; oscillation frequency; output power; peak-to-valley current ratio; planar slot antennas; power 1 muW; resonant tunneling diode; size 20 nm; ultrahigh peak current density; Capacitance; Current density; Diodes; Doping; Electrodes; Frequency; Gold; Oscillators; Resonant tunneling devices; Slot antennas;
fLanguage
English
Publisher
ieee
Conference_Titel
Indium Phosphide & Related Materials, 2009. IPRM '09. IEEE International Conference on
Conference_Location
Newport Beach, CA
ISSN
1092-8669
Print_ISBN
978-1-4244-3432-9
Electronic_ISBN
1092-8669
Type
conf
DOI
10.1109/ICIPRM.2009.5012476
Filename
5012476
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