DocumentCode
1716819
Title
New Approach Based on Double-Crossed Step-down-Stress Accelerated Life Testing
Author
Yuming, Wang ; Jinyan, Cai ; Zhanqiang, Jia
Author_Institution
Ordnance Eng. Coll., Shijiazhuang
fYear
2007
Abstract
New approach based on DCSDS-ALT which is a reverse process of traditional DCSUS-ALT is introduced. Procedure of this method is given, and numeral example is shown. Conclusions are that though DCSDS-ALT is not always better than DCSUS-ALT, its effect in improving testing efficiency is obvious when some product parameter reaches to certain value. For high reliability long lifetime test, this condition usually can be satisfied, so it is applicable.
Keywords
Monte Carlo methods; life testing; reliability; Monte-Carlo simulation; double-crossed step-down-stress accelerated life testing; long lifetime test; reverse process; Acceleration; Degradation; Educational institutions; Electronic equipment testing; Instruments; Life estimation; Life testing; Lifetime estimation; Stress; Temperature; Accelerated life testing; Monte-Carlo; efficiency ratio; simulation; step down stress;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Measurement and Instruments, 2007. ICEMI '07. 8th International Conference on
Conference_Location
Xi´an
Print_ISBN
978-1-4244-1136-8
Electronic_ISBN
978-1-4244-1136-8
Type
conf
DOI
10.1109/ICEMI.2007.4350419
Filename
4350419
Link To Document