DocumentCode
1716907
Title
X-pinch dynamics close to the time of X-ray burst emission, and X-pinch bright spot location using X-ray backlighting
Author
Shelkovenko, T.A. ; Pikuz, S.A. ; Sinars, D.B. ; Hammer, D.A. ; Greenly, J.B. ; Dimant, Y.S. ; Serlin, V.
Author_Institution
Lab. of Plasma Studies, Cornell Univ., Ithaca, NY, USA
fYear
1999
Firstpage
309
Abstract
Summary form only given, as follows. In the final few ns before the moment of the X-ray burst emission near the cross point of the two wires in an X-pinch, an on-axis Z-pinch forms, the dynamics of which have been studied using direct (point projection) X-ray backlighting. The rapid collapse of the Z-pinch results in a gap in the observable mass distribution, which we refer to as a minidiode. Two Mo X-pinches were placed in parallel between the output electrodes of the 450 kA, 100 ns XP pulser at Cornell University. The <0.5 ns radiation burst from each of the two X-pinches was used to generate a magnified X-ray backlighter image on film of the other one. The size of the X-ray source is sufficiently small that the spatial resolution in the images is close to 1 /spl mu/m. Using different wire sizes in the two X-pinches yields images separated in time by 4-20 ns; using the same wire size yields images separated in time by 0.5-2 ns. Therefore, the dynamics of the rapid collapse of the on-axis Z-pinch in conjunction with minidiode formation, and the break-up of that Z-pinch just as the bright X-ray spots develop can be studied using the successive images from 4 ns before X-ray burst emission, through the moment of burst emission, to a few ns after burst emission. By superimposing images generated by both X-pinches of a grid of fine wires on the same films as the X-pinch images, it has been possible to locate the position of the bright X-ray emission point(s) in the Z-pinch/minidiode region to within 10 /spl mu/m. The emission points are usually within 100 pm of the original cross point of the two wires, near the ends of the collapsing Z-pinch. Calibrated density measurements have been made with W X-pinches by including a W step wedge in the film pack.
Keywords
Z pinch; exploding wires; pinch effect; plasma diagnostics; 450 kA; Mo X-pinches; W; W X-pinches; W step wedge; X-pinch; X-pinch bright spot location; X-pinch dynamics; X-pinch images; X-ray backlighting; X-ray burst emission; X-ray source; XP pulser; bright X-ray spots; calibrated density measurements; collapsing Z-pinch; minidiode formation; Density measurement; Electrodes; Image generation; Laboratories; Mesh generation; Physics; Plasma x-ray sources; Spatial resolution; Wires; X-ray imaging;
fLanguage
English
Publisher
ieee
Conference_Titel
Plasma Science, 1999. ICOPS '99. IEEE Conference Record - Abstracts. 1999 IEEE International Conference on
Conference_Location
Monterey, CA, USA
ISSN
0730-9244
Print_ISBN
0-7803-5224-6
Type
conf
DOI
10.1109/PLASMA.1999.829685
Filename
829685
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