DocumentCode
1716973
Title
Material field strength studies at microsecond pulsed voltages
Author
Shiffler, D. ; LaCour, M. ; Hendricks, K. ; Umstattd, R. ; Spencer, T. ; Haworth, M. ; Vozz, D. ; Lovesee, A.
Author_Institution
Res. Lab., Kirtland AFB, NM, USA
fYear
1999
Firstpage
311
Abstract
Summary form only given. High power microwave tubes typically all share the same characteristic in that large electric field stresses, both pulsed and RF, can be present in the tube. These large field stresses can cause problems leading to pulse shortening. This poster reviews experiments to explore the behavior of various materials with a high voltage pulse of 1 microsecond and field stresses greater than 50 kV/cm. The voltage source used for the testing is the Cathode Test Bed, a pulse forming network based pulser with a 100 Ohm impedance. We review the results of tests with several different materials and show the field stresses at which breakdown of the material occurred.
Keywords
electric field effects; high-voltage techniques; microwave tubes; Cathode Test Bed; electric field stresses; high power microwave tubes; high voltage pulse; large field stresses; material field strength; microsecond pulsed voltages; pulse shortening; Cathodes; Displacement control; Electric variables control; Frequency; Input variables; Laboratories; Oscillators; Stress; Testing; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Plasma Science, 1999. ICOPS '99. IEEE Conference Record - Abstracts. 1999 IEEE International Conference on
Conference_Location
Monterey, CA, USA
ISSN
0730-9244
Print_ISBN
0-7803-5224-6
Type
conf
DOI
10.1109/PLASMA.1999.829688
Filename
829688
Link To Document