• DocumentCode
    1717367
  • Title

    RF evaluation of low-cost leadless packages and development of distributed electrical models

  • Author

    Chandrasekhar, Arun ; Brebels, Steven ; Beyne, Eric ; De Raedt, Walter ; Nauwelaers, Bart ; Van Bever, Tania

  • Author_Institution
    IMEC
  • fYear
    2003
  • Firstpage
    1550
  • Lastpage
    1558
  • Keywords
    Dielectric constant; Dielectric materials; Electronics packaging; Erbium; Predictive models; Radio frequency; Semiconductor device measurement; Semiconductor device packaging; Silicon; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 2003. Proceedings. 53rd
  • ISSN
    0569-5503
  • Print_ISBN
    0-7803-7791-5
  • Type

    conf

  • DOI
    10.1109/ECTC.2003.1216503
  • Filename
    1216503
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1717367