Title :
RF evaluation of low-cost leadless packages and development of distributed electrical models
Author :
Chandrasekhar, Arun ; Brebels, Steven ; Beyne, Eric ; De Raedt, Walter ; Nauwelaers, Bart ; Van Bever, Tania
Author_Institution :
IMEC
Keywords :
Dielectric constant; Dielectric materials; Electronics packaging; Erbium; Predictive models; Radio frequency; Semiconductor device measurement; Semiconductor device packaging; Silicon; Testing;
Conference_Titel :
Electronic Components and Technology Conference, 2003. Proceedings. 53rd
Print_ISBN :
0-7803-7791-5
DOI :
10.1109/ECTC.2003.1216503
