• DocumentCode
    1717374
  • Title

    High-Q niobium klyston cavities for use in gravitational wave detectors

  • Author

    Furtado, Sérgio R. ; Aguiar, Odylio D. ; Castro, Pedro J. ; Barroso, Joaquim J.

  • Author_Institution
    Astrophys. Div., Nat. Inst. for Space Res.-INPE, Sao Jose dos Campos, Brazil
  • fYear
    2009
  • Firstpage
    172
  • Lastpage
    176
  • Abstract
    The main purpose of this work was to measure the resonant frequency and the Q-factor for the niobium superconducting reentrant cavities to be used in parametric transducers of the gravitational wave detector Mario Schenberg. Many cavities were manufactured from niobium with high tantalum impurities (1420 ppm) and they were cryogenically tested to determine their resonance frequencies and unloaded electrical quality factors (Q0) related to the electromagnetic coupling. These cavities were closed using a niobium cover with tantalum impurities below 1000 ppm and the unloaded electrical quality factor Q0 = 2.65 × 105 was obtained. Another cavity similar to the one used by the Australian detector Niobe and made of niobium with low tantalum impurities was also investigated. The unloaded quality factor measured for this cavity was Q0 = 6.35 × 103. The experimental tests were performed in the laboratories of the National Institute for Space Research (INPE) and the Institute for Advanced Studies (IEAv-CTA).
  • Keywords
    electromagnetic coupling; gravitational wave detectors; klystrons; microwave parametric devices; niobium; superconducting cavity resonators; transducers; Nb; electrical quality factors; electromagnetic coupling; gravitational wave detectors; high-Q niobium klystron cavities; niobium superconducting reentrant cavities; parametric transducers; resonant frequency; Detectors; Frequency measurement; Impurities; Manufacturing; Niobium; Q factor; Resonance; Resonant frequency; Testing; Transducers; gravitational wave detector; klystron cavity; parametric transducer; superconducting niobium;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave and Optoelectronics Conference (IMOC), 2009 SBMO/IEEE MTT-S International
  • Conference_Location
    Belem
  • ISSN
    1679-4389
  • Print_ISBN
    978-1-4244-5356-6
  • Electronic_ISBN
    1679-4389
  • Type

    conf

  • DOI
    10.1109/IMOC.2009.5427605
  • Filename
    5427605