DocumentCode
1717871
Title
High frequency characterization of high temperature superconductors
Author
Williams, Jeffery T. ; Long, Stuart A. ; Wolfe, John C. ; Jackson, David R. ; Wilton, Donald R.
Author_Institution
Appl. Electron. Lab., Houston Univ., TX, USA
fYear
1989
Firstpage
1550
Abstract
A program has been established to develop and characterize thin-film high T/sub c/ superconducting materials for microwave and millimeter-wave applications. Presently, these efforts are focused on the characterization of YBa/sub 2/Cu/sub 3/O/sub x/ and Bi/sub 2/CaSr/sub 2/Cu/sub 2/O/sub r/ thin films, deposited on MgO substrates. A flash evaporation technique has been developed for depositing these materials which produces films with zero resistance critical temperatures in the range of 75 K to 85 K, excellent stoichiometry and alignment, and microwave surface resistances on the order of copper. The technique developed has the advantage of being able to maintain stoichiometry over large substrate areas. For circuit patterning, chemically assisted ion beam etching of superconductors has been developed. Characterization techniques are described. The microwave properties of the superconducting thin films are determined from measurements of the resonance behavior of microstrip, stripline, and cavity resonators.<>
Keywords
high-temperature superconductors; microwave devices; microwave measurement; superconducting devices; 75 to 85 K; Bi/sub 2/CaSr/sub 2/Cu/sub 2/O/sub r/; Cu; HF characterisation; MgO; YBa/sub 2/Cu/sub 3/O/sub x/; alignment; cavity resonators; chemically assisted ion beam etching; circuit patterning; flash evaporation technique; high temperature superconductors; measurements; microstrip resonators; microwave applications; microwave properties; microwave surface resistances; millimeter-wave applications; resonance behavior; stoichiometry; stripline resonators; thin-film high T/sub c/ superconducting materials; zero resistance critical temperatures; Bismuth; Copper; Frequency; High temperature superconductors; Millimeter wave technology; Sputtering; Substrates; Superconducting materials; Superconducting thin films; Surface resistance;
fLanguage
English
Publisher
ieee
Conference_Titel
Antennas and Propagation Society International Symposium, 1989. AP-S. Digest
Conference_Location
San Jose, CA, USA
Type
conf
DOI
10.1109/APS.1989.135018
Filename
135018
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