Title :
Built-in Self-test Scheme for IIR Digital Filter
Author :
Decai, Yang ; Guangju, Chen ; Yongle, Xie
Author_Institution :
Univ. of Electron. Sci. & Technol. of China, Chengdu
Abstract :
A built-in self-test (BIST) scheme is proposed for IIR digital filter chip. It needs no modification of the basic building cells and can detect all the non-redundant stuck-at faults in reasonable time. The testability of its cells is analyzed and the deterministic test sequence is deduced. By reusing available arithmetic function units such as adder to generate test vectors and compact test responses, this scheme can be implemented at-speed with minimum hardware overhead and performance degradation.
Keywords :
IIR filters; built-in self test; logic testing; BIST; IIR digital filter; arithmetic function units; built-in self-test scheme; deterministic test sequence; stuck-at faults detection; Automatic testing; Built-in self-test; Degradation; Digital filters; Feedback loop; Hardware; IIR filters; Instruments; Semiconductor device measurement; Switches; IIR filter; built-in self-test; design-for-test;
Conference_Titel :
Electronic Measurement and Instruments, 2007. ICEMI '07. 8th International Conference on
Conference_Location :
Xi´an
Print_ISBN :
978-1-4244-1136-8
Electronic_ISBN :
978-1-4244-1136-8
DOI :
10.1109/ICEMI.2007.4350459
