Title :
Investigation of diagnostic sensors and control models for a compact ion source
Author :
Tsai, M.-H. ; Grotjohn, Timothy A.
Author_Institution :
Michigan State Univ., East Lansing, MI, USA
Abstract :
Summary form only given, as follows. The diagnostic measurement, modeling, and control of a compact ion/radical source operating at 2.45 GHz microwave frequency is investigated for argon and hydrogen discharges. The investigation of the plasma source includes relating the run-time adjustable inputs, plasma source sensor outputs and process control models. The adjustable inputs include input microwave power, chamber pressure, gas flow rate, and resonant cavity tuning. The plasma source sensor outputs include reflected microwave power, electron temperature, ion density, electron/ion energy distribution and plasma potential. In order to determine the neutral and charged species in the hydrogen discharge, actinometry and OES measurements are used. The process model is the relationship between sensor measurements and input settings or the relationship of output parameters to the input and sensor readings. The sensor measurements combined with analytical and numerical models are used to estimate the plasma source output at various positions.
Keywords :
discharges (electric); ion density; ion sources; plasma density; plasma diagnostics; plasma production; plasma temperature; radiometry; 2.45 GHz; Ar; Ar discharges; H/sub 2/; H/sub 2/ discharges; OES measurements; actinometry; analytical models; chamber pressure; compact ion source; compact ion/radical source; control models; diagnostic sensors; electron temperature; electron/ion energy distribution; gas flow rate; input microwave power; ion density; microwave frequency; modeling; numerical models; plasma potential; plasma source; plasma source sensor outputs; process control models; reflected microwave power; resonant cavity tuning; run-time adjustable inputs; Electrons; Fault location; Frequency measurement; Hydrogen; Microwave frequencies; Microwave measurements; Plasma measurements; Plasma sources; Plasma temperature; Temperature sensors;
Conference_Titel :
Plasma Science, 1997. IEEE Conference Record - Abstracts., 1997 IEEE International Conference on
Conference_Location :
San Diego, CA, USA
Print_ISBN :
0-7803-3990-8
DOI :
10.1109/PLASMA.1997.604363